| 德國(guó)Mahr馬爾輪廓粗糙度儀一體機(jī)UD130馬爾粗糙度儀馬爾輪廓儀代理商 |
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德國(guó)Mahr馬爾輪廓粗糙度儀一體機(jī)UD 130 馬爾粗糙度儀 馬爾輪廓儀 代理商
馬爾輪廓粗糙度儀一體機(jī)MarSurf UD 130 | Art.-Nr. 6720823 定位速度 0.1 mm/s 至 30 mm/s 掃描長(zhǎng)度末尾(X 方向) 130 mm 測(cè)量速度 0.1 mm/s 至 5 mm/s; 用于粗糙度測(cè)量 建議 0.1 mm/s 至 0.5 mm/s 分辨率 2 nm 測(cè)頭 標(biāo)準(zhǔn)測(cè)頭 LP-D 14-10-2/60 度 測(cè)量范圍 mm 10 mm(100 mm 測(cè)桿) 20 mm(200 mm 測(cè)桿) 輪廓分辨率 2 nm 掃描長(zhǎng)度 0.1 mm 至 130 mm 測(cè)量力 (N) 1 mN 至 30 mN,可軟件調(diào)整
With the MarSurf UD 130, Mahr has created the successor to the successful MarSurf UD 120 and closes the gap between the highend solution MarSurf LD 130 / LD 260 and the standard combination measuring station MarSurf XCR 20 with two drive units. The technical data of the MarSurf UD 130 have been decisively improved, especially the measuring and positioning speeds enable the reduction of the measuring times per workpiece. Different probe arms and probe tip geometries are available for different measuring tasks. Depending upon the measuring tasks, diamond tips with 2 μm and 5 μm radius can be used for roughness measurements, carbide tips with 25 μm for contour measurements or ruby balls. The MarSurf UD 130 and the MarSurf LD 130 / LD 260 enable high-precision measurements in the nm range. Patented solutions, such as the probe arm changing unit make these measuring stations also suitable for automated measuring operations. Roughness and contour in one measurement You only need a fraction of the time and yet you measure faster, more precisely and more efficiently. After only one measurement, you have all the results of the roughess and contour analysis at your finger tips. More time for other tasks! The most modern measuring technology for small tolerances enables a high, constant accuracy over a large measuring range with high resolution. High measuring and positioning speed greatly minimize the measuring times Positioning speed up to 30 mm/s Measuring speed up to 5 mm/s Innovative probe arm solution Bionic design of the probe arms and new materials ensure higher rigidty, reduced vibration behavior, higher dynamics. Faster and safer exchange of the probe arms with simultaneous probe arm recognition through magnetic holder and reliable recognition due to the chip in the probe arm. Service-friendly thanks to modular concept Maintenance without complete disassembly of the measurng stand possible. |
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